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Test-time Verification via Optimal Transport: Coverage, ROC, & Sub-optimality
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Frames verifier-based test-time sampling as an optimal transport problem under a chi-square coverage constraint, deriving exact sub-optimality and compute for accept-if-correct, sequential/batched rejection sampling, maximal coupling, and best-of-N with imperfect verifiers, validated on Qwen3 models.
Problem
Test-time verification with imperfect verifiers: how far sampling-based verification can approximate the verifier-induced optimal policy, given the generator's coverage and the verifier's accuracy (ROC / Youden's index).
Approach
Casts test-time verification as a transport plan from the reference distribution to the chi-square-constrained optimal policy; the Hamming optimal transport cost plus Youden's index yields a three-regime (transport, policy improvement, saturation) sub-optimality-coverage geometry, and proposes SRS and SMC sequential algorithms plus batched BRS that satisfy the coverage constraint.
Key results
- Sub-optimality of SRS and SMC follows three regimes (O(sqrt(beta)) growth, policy-improvement decrease scaled by Youden's index, then plateau) on Qwen3 models.
- SRS and SMC have identical expected number of proposals, E[tau] = (1 ∧ m_beta(s_ver))/s_ver, improving on AiC by factor m_beta(s_ver).
- AiC violates the coverage constraint for beta < 1/s_ver but matches SRS/SMC in the saturation regime.
Surprising findings
- SMC underperforms SRS when the assumed s is below the true value and outperforms it when above, showing SMC is sensitive to verifier-accuracy misspecification.
- When s = 1, SRS, SMC and AiC all reduce to AiC.
Limitations
- Theory assumes the reference mass s_ver is available to the algorithm, while in practice it is tuned as a hyperparameter.
- Analysis uses ratio-based (chi-square) coverage; difference-based coverage is unexplored.
- Restricted to verifiable binary rewards rather than general reward models.
Experimental setup
Metrics: sub-optimality expected number of proposals
Baselines: accept-if-correct (AiC) best-of-N (BoN) sequential rejection sampling (SRS) sequential maximal coupling (SMC)
Builds on: best-of-N sampling rejection sampling maximal coupling chi-square coverage constraint
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