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Improved Scaling Laws in Linear Regression via Data Reuse

NeurIPS 2025 · Optimization › Implicit bias and generalization · approach: Shallow ReLU network convergence · 0 citations (OpenAlex)

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Shows via sketched linear regression theory that multi-pass SGD with geometric stepsize decay achieves test error Θ(M^{1-b}+T^{(1-b)/a}) for T≲N^{a/b} steps, improving on one-pass scaling when data is reused.

Problem

Existing provable neural scaling laws for linear regression cover only one-pass SGD, which is unsustainable when fresh data runs out; it is unclear how data reuse via multi-pass SGD affects test-error scaling in model size M and sample size N.

Approach

Derives sharp finite-sample test error bounds for the last iterate of multi-pass SGD on M-dimensional Gaussian-sketched linear models with power-law data and prior spectra, decomposing risk into approximation, bias, variance and a new fluctuation error term from random sampling, showing that reused data scales better than one-pass SGD when the step count exceeds N.

Key results

Measured effects reported in the paper

What was changedWhereMeasuredEffect
Reuse the training data for multiple passes, with optimal effective steps stepeff ≃ N^{a/b}Multi-pass SGD on an M-dimensional sketched linear model · Data-constrained linear regression (N ≪ M^b; a > b > 1)excess test error rate: Θ(N^{(1-b)/a}) -> Θ(N^{(1-b)/b})Helped
Use multiple passes rather than one pass when a < b < a+1SGD on an M-dimensional sketched linear model · Data-constrained linear regression (a < b < a+1)excess test error rateNo clear effect
Use constant-stepsize SGD with iterate averaging instead of geometrically decaying stepsizesMulti-pass SGD · Linear regression simulationsexcess test error scalingNo clear effect
Use multi-pass SGD with sequential sample reuse without replacement in each epochMulti-pass SGD · Non-Gaussian-design simulationfitted exponent: 0.26 -> 0.34Helped

Surprising findings

Limitations

Experimental setup

Datasets: synthetic Gaussian linear regression data synthetic non-Gaussian (Rademacher-type) design for robustness check

Metrics: excess test error fitted log-log scaling exponents

Baselines: one-pass SGD gradient descent

Builds on: one-pass SGD scaling laws in linear regression (Lin et al.) Gaussian random sketching neural scaling laws (Kaplan et al.) Muennighoff et al. data-constrained scaling

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