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3D Measurement of Complex Textured Objects Based on Bidirectional Fringe Projection

AAAI 2025 · Point clouds › Point cloud classification · approach: Point cloud detection and tracking · 2 citations (OpenAlex)

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Proposes ELPC-PCF, which models defocus-induced phase errors at reflectivity edges, corrects them with bidirectional (horizontal and vertical) fringe projection plus epipolar constraints, and fuses the resulting point clouds to improve 3D measurement of textured objects.

Problem

Structured-light / fringe projection profilometry accuracy degrades on objects with complex textures, especially at color boundaries, because camera defocus convolves reflectivity and biases phase.

Approach

An error model linking phase error to phase and grayscale gradients at texture edges; bidirectional fringe projection supplies an extra epipolar constraint that lets the correction value be solved directly without PSF calibration, followed by averaging of point clouds from the two directions.

Key results

Measured effects reported in the paper

What was changedWhereMeasuredEffect
Apply ELPC-PCF instead of TEMFPP · Calibration plateMAE: 0.397 -> 0.221Helped
Apply ELPC-PCF instead of TEMFPP · Calibration plateRMSE: 0.712 -> 0.348Helped
Apply ELPC-PCF instead of TEMFPP · Card holderMAE: 0.332 -> 0.234Helped
Apply ELPC-PCF instead of TEMFPP · PostcardMAE: 0.169 -> 0.101Helped
Apply ELPC-PCF instead of TEMFPP · SphereMAE: 0.281 -> 0.153Helped
Apply ELPC-PCF instead of TEMFPP · VaseMAE: 0.380 -> 0.259Helped
Apply ELPC-PCF instead of OEMFPP · CylinderRMSE: 0.395 -> 0.260Helped
Add ELPC phase correction (ablation)FPP · Calibration plateMAE: 0.645 -> 0.240Helped
Add point-cloud fusion (ablation)FPP · Calibration plateMAE: 0.645 -> 0.317Helped

Surprising findings

Limitations

Experimental setup

Benchmarks: calibration plate card holder postcard standard sphere vase cylinder

Metrics: MAE RMSE computation time

Baselines: KE (kernel estimation) IFT (inverse Fourier transform) OEM TEM HFP VFP DHFP

Builds on: Rao and Da two-dimensional error model (TEM) Hu et al. one-dimensional error model (OEM) Zhang's calibration method Phase-shifting with CGC

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