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Research map / Probabilistic and scientific modeling / Variational and generative sampling

Goodness-of-Fit Testing for Discrete Distributions via Stein Discrepancy

ICML 2018 · Probabilistic and scientific modeling › Variational and generative sampling · approach: Likelihood-free and graphical model estimation · 21 citations (OpenAlex)

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Measured effects reported in the paper

What was changedWhereMeasuredEffect
Use KDSD goodness-of-fit test (difference Stein operator, exponentiated Hamming kernel) instead of MMD two-sample testIsing model (10x10 lattice, d=100), T0=5 and T0=20 · Ising model goodness-of-fit testingfalse-negative rate (Type-II error)Helped
Use KDSD goodness-of-fit test instead of MMD two-sample testBernoulli RBM (M=50 visible, K=25 hidden) · Bernoulli RBM goodness-of-fit testingfalse-negative rate (Type-II error)Helped
Use KDSD goodness-of-fit test instead of MMD two-sample testERGM (20 nodes, d=190) · ERGM goodness-of-fit testingfalse-negative rate (Type-II error)Mixed
Use KDSD goodness-of-fit test instead of MMD two-sample testAll three models (Ising, RBM, ERGM) · false-positive rate at alpha=0.05false-positive rate (Type-I error)No clear effect
Use the exponentiated Hamming kernel rather than the naive delta kernel for discrete inputsKDSD on discrete spaces · discrete kernel choicequalitative (curse of dimensionality)No clear effect

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