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Research map / Probabilistic and scientific modeling / Variational and generative sampling

Using Perturbation to Improve Goodness-of-Fit Tests based on Kernelized Stein Discrepancy

ICML 2023 · Probabilistic and scientific modeling › Variational and generative sampling · approach: Posterior sampling with diffusion guidance · 0 citations (OpenAlex)

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Measured effects reported in the paper

What was changedWhereMeasuredEffect
Add MH-type jump perturbation (sum over grid of kernels, spKSD) to KSDKSD test on bimodal Gaussian mixture with mixing-weight difference · 1D Gaussian mixture, mode separation largerejection rate: from near 0.05 to almost perfect powerHelped
Use standard KSD on well-separated bimodal mixtures with differing mixing weightsKSD test · 1D Gaussian mixture, mode separation largerejection rate: power converges to test level 0.05Hurt
Use optimised jump scale perturbation (ospKSD) instead of standard KSD on RAM samples with missing modesRAM sample GOF test at sigma=0.5rejections out of 10: ospKSD 0 vs KSD 0 at sigma=0.5; ospKSD 8 vs KSD 0 at sigma=0.1; ospKSD 8 vs KSD 10 at sigma=1.08Mixed
Use grid-based spKSD instead of standard KSD on RAM samplesRAM sample GOF test · RAM scale sigma=0.1rejections out of 10: spKSD 0 vs KSD 0No clear effect

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